智誠實業股份有限公司 - PROBE PIN 公司簡介 環境及設備介紹 Deprecated: Function split() is deprecated in /home/smart/public_html/modules/mod_mainmenu.php ... 另有LCD 專用PROBE CARD 測試針。 LCD 測試專用 PROBE CARD 設計製作 Deprecated: Function ereg() is deprecated in ...
Probe Card Basics - JEM America Corp This section is intended to provide general information about the function of a probe card, as well as an introduction to its primary components. This is not to provide any specific manufacturing instructions, but simply to help ...
Probe Card 的用途是什麼呢 - Yahoo!奇摩知識+ probe card 簡介, probe card工程師, probe card 製造, 探針卡 probe card, probe card 維修工程師, probe card是什麼, probe card助理工程師, probe card wafer, probe card 種類, probe card ...
旺矽科技股份有限公司-Probe Card Probe Card Cantilever Type | Vertical Type Probe Card for Multi-DUT Multi-DUT probe card for Memory devices. Design and manufacturing capability up to 32 DUT. Probe Card for LCD Driver TCP (Dual DUT) Double your through put by new released dual-site TCP .
稚欣科技/產品介紹/RF Probe Card APW RF Probe card Brief You can easily mount our RF probe card on the any types of your probe station. (Manual probe station, semi-auto probe station, fully-auto probe station) Feature: Customize layout (you can design your RF device without pitch ...
CTimes - 積體化探針卡技術介紹: - Probe card,測試系統與 ... Probe Card for IC Testing 探針卡（probe card）是應用在積體電路（IC）尚未封裝前，對裸晶以探針（probe）做功能測試，篩選出不良品、再進行之後的封裝工程。因此 ...
半導體測試簡介 半導體IC測試基本名詞介紹. • Probe Card:針測板. • Socket:IC測試時承載之基座. • Bin:IC分類之稱呼. • Change Kit:變異製具. • Lead Scan:掃腳機. • Ball Scan:掃球機.
旺矽科技股份有限公司-Probe Card MLO\MLC Type VPC. Vertical probe for solder bump devices, contact with area array pads layout. Multi-Layer-Organic space transformer.
開啟檔案 VLSI 測試理論. 期中考報告. 學生：王建弘. 學號：M9830112. 中 華 民 國2010 年4 月28 日. Outline. Probe Card簡介; Tester(測試機); Why Do We Test? 封裝測試 ...
